Author: Stoupin, S.
Paper Title Page
TUPLH08 X-Ray and Charged Particle Detection by Detuning of a Microwave Resonator 503
  • S.P. Antipov, P.V. Avrakhov, E. Dosov, E. Gomez, S.V. Kuzikov
    Euclid TechLabs, LLC, Solon, Ohio, USA
  • S. Stoupin
    Cornell University (CLASSE), Cornell Laboratory for Accelerator-Based Sciences and Education, Ithaca, New York, USA
  • A.A. Vikharev
    IAP/RAS, Nizhny Novgorod, Russia
  Funding: DOE SBIR
Charged particle detection is important for beam alignment, beam loss and background control. In case of halo detection, traditional wire scanner measurement utilizing carbon or tungsten wires is limited by the damage threshold of these materials. In this paper we present an electrodeless method to measure halo with a diamond scraper. This measurement utilizes a microwave resonator placed around the diamond scraper which is sensitive to charged particle-induced conductivity. Due to this transient induced conductivity in the dielectric, a microwave coupling to the resonator changes. Diamond in this case is chosen as a radiation hard material with excellent thermal properties. The absence of electrodes makes the device robust under the beam. The same measurement can be done for x-ray flux monitoring which is important for measurement feedback and calibration at modern x-ray light sources. In this case x-rays passing through the diamond sensing element enable a photo-induced conductivity and that in turn detunes the cavity placed around the diamond. Diamond being a low-Z material allows for in-line x-ray flux measurement without significant beam attenuation.
DOI • reference for this paper ※  
About • paper received ※ 28 August 2019       paper accepted ※ 05 September 2019       issue date ※ 08 October 2019  
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