|TUPLH09||Thermal Effects on Bragg Diffraction of XFEL Optics||506|
|SUPLH05||use link to see paper's listing under its alternate paper code|
Funding: The US Department of Energy (DOE) (DE-AC02-76SF00515); The US DOE Office of Science Early Career Research Program grant (FWP-2013-SLAC-100164).
Crystal optical devices are widely used in X-ray free electron laser (XFEL) systems, monochromators, beam splitters, high-reflectance backscattering mirrors, lenses, phase plates, diffraction gratings, and spectrometers. The absorption of X-ray in these optical devices can cause increase of temperature and consequent thermal deformation, which can dynamic change in optic output. In self-seeding XFEL, the thermal deformation and strain in monochromator could cause significant seed quality degradation: central energy shift, band broadening and reduction in seed power. To quantitatively estimate the impact of thermomechanical effects on seed quality, we conduct thermomechanical simulations combined with diffraction to evaluate the seed quality with residual temperature field in a pump-probe manner. With our results, we show that a critical repetition rate could be determined, once the criteria for deviation of the seed quality are selected. This tool shows great potential for the design of XFEL optics for stable operation.
|DOI •||reference for this paper ※ https://doi.org/10.18429/JACoW-NAPAC2019-TUPLH09|
|About •||paper received ※ 28 August 2019 paper accepted ※ 13 September 2019 issue date ※ 08 October 2019|
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