Author: Litos, M.D.
Paper Title Page
Electro-Optic Sampling Beam Position Monitor  
  • K.D. Hunt-Stone, R.A. Ariniello, J.R. Cary, C.E. Doss
    CIPS, Boulder, Colorado, USA
  • J.R. Cary
    Tech-X, Boulder, Colorado, USA
  • M.D. Litos
    Colorado University at Boulder, Boulder, Colorado, USA
  Funding: This work was supported in part by the U.S. D.O.E. grant number DE-SC0017906.
Electron beam-driven plasma wakefield accelerator (PWFA) experiments at SLAC’s FACET-II research facility will require diagnostics that can measure the transverse position of both the drive beam and the witness beam in a single shot. This is a challenge for ordinary beam position monitors due to the close temporal spacing between the two bunches, usually on the order of 300 fs. Here we will discuss the concept for an electro-optic sampling beam position monitor (EOS-BPM) that can measure the transverse position of the individual bunches with roughly 10 µm spatial resolution, and 50 fs temporal resolution. The EOS-BPM has the advantage of being a non-destructive, single shot measurement. It uses two EO crystals on either side of the beamline. The half-cycle THz fields of the electron beams induce a birefringence in the crystals which are probed by a chirped laser pulse. The longitudinal current profile is spectrally encoded into the probe laser, while the transverse position for each bunch is encoded in the relative strength of the signal in either crystal. We present simulations demonstrating the effectiveness of an EOS-BPM in the context of PWFA experiments planned for FACET-II.
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