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TY - CONF AU - Lee, H.R. AU - Buaphad, P. AU - Cho, B.L. AU - Han, M.Y. AU - Jeong, I.G. AU - Joo, Y. AU - Kim, Y. AU - Lee, J.Y. AU - Lee, S.H. AU - Suk, H. ED - Yamazaki, Yoshishige ED - Raubenheimer, Tor ED - McCausey, Amy ED - Schaa, Volker RW TI - Optimization of Beam Parameters for UEM with Photo-Emission S-Band RF Gun and Alpha Magnet J2 - Proc. of NAPAC2019, Lansing, MI, USA, 01-06 September 2019 CY - Lansing, MI, USA T2 - North American Particle Accelerator Conference T3 - 4 LA - english AB - Ultrafast Electron Microscopy (UEM) is a powerful tool to observe ultrafast dynamical processes in sample materials at the atomic level. By collaborating with KRISS and GIST, the future accelerator R&D team at KAERI has been developing a UEM facility based on a photo-emission S-band (=2856 MHz) RF gun. Recently, we have added an alpha magnet in the beamline layout of the UEM to improve beam qualities such as emittance, divergence, energy spread, and bunch length. To achieve high spatial and time resolutions, we have been optimizing those beam parameters and other machine parameters by performing numerous ASTRA and ELEGANT code simulations. In this paper, we describe our ASTRA and ELEGANT code optimizations to obtain high-quality beam parameters for the UEM facility with a photo-emission S-band RF gun and an alpha magnet. PB - JACoW Publishing CP - Geneva, Switzerland SP - 440 EP - 442 KW - electron KW - gun KW - emittance KW - laser KW - simulation DA - 2019/10 PY - 2019 SN - 2673-7000 SN - 978-3-95450-223-3 DO - doi:10.18429/JACoW-NAPAC2019-TUPLM33 UR - http://jacow.org/napac2019/papers/tuplm33.pdf ER -