Author: Kumar, R.
Paper Title Page
TUZBB5 Transverse Ion Beam Emittance Growth Due to Low Frequency Instabilities in Microwave Ion Source Plasma 363
SUPLM10   use link to see paper's listing under its alternate paper code  
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  • C. Mallick, M. Bandyopadhyay, R. Kumar
    Institute for Plasma Research, Bhat, Gandhinagar, India
  The ion source is accompanied by the generation of low frequency (LF) plasma instabilities (PI). Its signature is also visible in high current heavy ion beam required for any accelerator. These LFs affect the profile of the ion beam in transverse phase-space. These issues are investigated in detail by measuring the emittance of beam. Beam oscillations are extracted from the transverse emittance data by taking Fast Fourier Transform (FFT) of it. PI frequencies are identified in the measured electromagnetic emission from the plasma, in which these frequencies appeared as sidebands around pump frequency 2.45 GHz. The PI components i.e.,ion acoustic (IA) and ion cyclotron (IC) waves are also visible in the FFT spectra. Low and high frequency oscillations in the beam are 476 kHz and ~1.3 MHz respectively. These two groups of frequencies also exist within the PI induced IA (238 - 873 kHz) and IC (1.29 - 1.3 MHz) frequency ranges. The measured emittance (rms-normalized) in horizontal and vertical phase-space varies from 0.002-0.098 𝜋 mm mrad and 0.004-0.23 𝜋 mm mrad respectively. PI induced beam oscillation is the reason behind such broad transverse emittance growth.
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About • paper received ※ 26 August 2019       paper accepted ※ 02 September 2019       issue date ※ 08 October 2019  
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